2010
2009
20081. “RF characterization and isolation properties of mesoporous Si by on-chip coplanar waveguide measurements”, Contopanagos, H., Zacharatos, F., Nassiopoulou, A.G., Solid-State Electr., 52 (11), pp. 1730-1734 (2008) 2. “Optical properties of periodic structures of metallic nanodisks”, G. Gatzounis, N. Stefanou, and N. Papanikolaou, Phys. Rev. B 77, 035101 (2008) 3. “Self-assembled hexagonal ordering of Si nanocrystals embedded in SiO2 nanodots”, A. G. Nassiopoulou, V. Gianneta, M. Huffman, M. A. Reading, J. A. Van Den Berg, I. Tsiaoussis, N. Frangis, Nanotechnology 19, 495605 (2008) 4. “Highly ordered hexagonally arranged nanostructures on silicon through a self-assembled silicon-integrated porous anodic alumina masking layer”, F. Zacharatos, V. Gianneta and A. G. Nassiopoulou, Nanotechnology 19, 495306 (2008) 5. “Understanding artificial optical magnetism of periodic metal-dielectric-metal layered structures”, C. Tserkezis, N. Papanikolaou, G. Gantzounis, N. Stefanou, Phys. Rev. B 78, 165114 (2008) 6. “A combined experimental and simulation study on thickness dependence of the emission characteristics in multicolor single layer organic light-emitting diodes”, N. A. Stathopoulos, M. Vasilopoulou, L. C. Palilis, D. G. Georgiadou, and P. Argitis, Appl. Phys. Lett. 93, 083310 (2008) 7. "Liquid phase direct laser printing of polymers for chemical sensing applications", C.Boutopoulos, V.Tsouti, D. Goustouridis, S.Chatzandroulis and I.Zergioti, Appl. Phys. Lett. 93, 191109 ,2008 8. “Surfacenano/microfunctionalization of PMMA thin films by 157 nm irradiation for sensing applications”, E.Sarantopoulou, Z.Kollia, A.C.Cefalas, K.Manoli, M.Sanopoulou, D.Goustouridis, S.Chatzandroulis, I.Raptis, Appl. Surf. Sci. 254 1710(2008) 9. “Formation and metrology of dual scale nano-morphology on SF6 plasma etched silicon surfaces”, G. Boulousis, V. Constantoudis, G. Kokkoris, E. Gogolides, Nanotechnology, 19 (25), pp.255301 (2008) 10. “Electron beam lithography simulation for the patterning of EUV masks”, N.Tsikrikas, G.P.Patsis, I.Raptis, A.Gerardino, E.Quesnel, Jpn. J. Appl. Phys. 47 4909 (2008) 11. “Growth and electrical characterization of thin conductive Au nanoparticle chains on oxidized Si substrates between electrodes for sensor applications”, Zoy, A., Nassiopoulou, A.G., Phys. Stat. S. (a) Applications and Materials, 205 (11), pp. 2621-2624 (2008) 12. “Auger recombination in silicon nanocrystals embedded in SiO2 wide band-gap lattice”, Mahdouani, M., Bourguiga, R., Jaziri, S., Gardelis, S., Nassiopoulou, A.G., Phys. Stat. Sol. (a) Applications and Materials, 205 (11), pp. 2630-2634 (2008) 13. “Investigation of the undershoot effect in polycrystalline silicon thin film transistors”, Michalas, L., G.J. Papaioannou, D.N. Kouvatsos and A.T. Voutsas, Sol. State Electron. 52 (3), 394, 2008 14. “Study of Base Series Resistance Losses in Single and Double Emitter Silicon Solar Cells Through Simulations and Experiments”, K. Kotsovos, K. Misiakos, Progress in Photovoltaics, vol. 16, issue: 7, pages: 577-584 15. “Broadband electrical characterization of macroporous silicon at microwave frequencies”, Contopanagos, H., Pagonis, D.N., Nassiopoulou, A.G., Phys. Stat. S. (a) Applications and Materials, 205 (11), pp. 2548-2551 (2008) 16. “Columnar growth of ultra-thin nanocrystalline Si films on quartz by Low Pressure Chemical Vapor Deposition: Accurate control of vertical size”, Lioutas, Ch.B., Vouroutzis, N., Tsiaoussis, I., Frangis, N., Gardelis, S., Nassiopoulou, A.G., Phys. Stat. S. (a) Applications and Materials, 205 (11), pp. 2615-2620 (2008) 17. “Efficient infared emission from periodically patterned thin metal films on a Si photonic crystal”, P. Theodoni, P. Bayiati, M. Chatzichristidi, Th. Speliotis, V. Em. Vamvakas, I. Raptis, and N. Papanikolaou, Microelectronic Engineering 85 1112-1115 (2008) 18. “Oriented spontaneously formed nano-structures on poly(dimethylsiloxane) films and stamps treated in O2 plasmas”, Tsougeni, K., Boulousis, G., Gogolides, E., Tserepi, A., Microelectronic Engineering, 85 (5-6), pp. 1233-1236, (2008) 19. “High-density plasma silicon oxide thin films grown at room-temperature”, Vlachopoulou, M.E., Dimitrakis, P., Tserepi, A., Vamvakas, V.Em., Koliopoulou, S., Normand, P., Gogolides, E., Tsoukalas, D., Microelectronic Engineering 85 (5-6), pp. 1245-1247, (2008) 20. “Growth and electrical characterization of thin conductive Au nanoparticle chains on oxidized Si substrates between electrodes for sensor applications”, Zoy, A., Nassiopoulou, A.G., Phys. Stat. S. (a) Applications and Materials, 205 (11), pp. 2621-2624 (2008) 21. “Realization and simulation of high aspect ratio micro/nano structures by proton beam writing”, E.Valamontes, M.Chatzichristidi, N.Tsikrikas, D.Goustouridis, I.Raptis, C. Potiriadis, J.A.vanKan, F.Watt, Jpn. J. Appl. Phys. 47 8600 (2008) 22. “A thermal vacuum sensor fabricated on plastic substrate - Study in various operation modes”, Petropoulos, A., Kaltsas, G., Nassiopoulou, A.G., Phys. Stat. S. (a) Applications and Materials, 205 (11), pp. 2639-2642 (2008) 23. “Copper-filled macroporous Si and cavity underneath for microchannel heat sink technology”, Zacharatos, F., Nassiopoulou, A.G., Phys. Stat. S. (A) Applications and Materials, 205 (11), pp. 2513-2517 (2008) 24. “Patterned thin metal films on a Si photonic crystal for efficient IR emission”, P.Theodoni, P.Bayiati, M.Chatzichristidi, T.Speliotis, V.Vamvakas, I.Raptis, N.Papanikolaou, Microelectronic Engineering 85 1112(2008) 25. “Large asymmetries of magnetoresistance loops in Co-line structures”, C.Christides, Th.Speliotis, M.Chatzichristidi, I.Raptis, Microelectronic Engineering 85 1382(2008) 26. “Efficient infared emission from patterned thin metal films on a Si photonic crystal”, P. Theodoni, V. Em. Vamvakas, Th. Speliotis, M. Chatzichristidi, P. Bayiati, I. Raptis, and N. Papanikolaou, Phys. stat. sol. (a) 205, No. 11, 2581–2584 (2008) 27. “Energy transfer processes among emitters dispersed in a single polymer layer for colour tuning in OLEDs”, D. Georgiadou, M. Vasilopoulou, G. Pistolis, D. Dimotikali, P. Argitis, Phys. Stat. S. (a) Applicat. and Materials 205 (11), 2008, pp. 2526-2531 28. “All-organic optocouplers based on polymer light-emitting diodes and photodetectors”, N. Stathopoulos, L. C. Palilis, M. Vasilopoulou, A. Botsialas, P. Falaras, and P. Argitis, Phys. Stat. Sol. (a) Applications and Materials 205 (11), 2008, pp. 2522-2525. 29. “Hot-wire CVD of copper films on self-assembled-monolayers of MPTMS”, G. Papadimitropoulos, A. Arapoyanni and D. Davazoglou, Phys. Stat. S. (a) Applications and Materials 205 (11), 2008, pp. 2607-2610 30. “KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals”, C. Dumas, L. Ressier, J. Grisolia, A. Arbouet, V. Paillard, G. BenAssayag, S. Schamm, P. Normand, Microelectronic Engineering 85, 2358-2361 (2008) 31. “Molecular weight and processing effects on the dissolution properties of thin poly(methyl methacrylate) films”, A.Kokkinis, E.S.Valamontes, D.Goustouridis, Th.Ganetsos, K.Beltsios, I.Raptis, Microelectronic Engineering 85 93(2008) 32. “Direct laser printing of biotin microarrays on low temperature oxide on Si substrates”, C.Boutopoulos, P.Andreakou, D.Kafetzopoulos, S. Chatzandroulis, I.Zergioti, Phys. Stat. Sol. (a), vol. 205, no. 11, pp. 2505 – 2508, (2008) 33. “Modelling MOSFET gate length variability for future technology nodes”, Patsis, G.P., Phys. Stat. S. (A) Applications and Materials, 205 (11), pp. 2541-2543, (2008) 34. “Ultrafast time-resolved spectroscopy of Si nanocrystals embedded in SiO2 matrix”, Lioudakis, E., Emporas, A., Othonos, A., Nassiopoulou, A.G., J. of Alloys and Compounds, doi:10.1016/j.jallcom.2008.07.193, Article in Press (2008) 35. “Enhancement and red shift of photoluminescence (PL) of fresh porous Si under prolonged laser irradiation or ageing: Role of surface vibration modes“, Gardelis, S., Nassiopoulou, A.G., Mahdouani, M., Bourguiga, R., Jaziri, S., Physica E: Low-Dimensional Systems, doi:10.1016/j.physe.2008.08.021, Article in Press (2008) and Nanostructures, 36. “A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance”, Moschou, D.C., M.A. Exarchos, D.N. Kouvatsos, G.J. Papaioannou, A.T. Voutsas, Microelectronic Engineering 85 (5-6), 1447, May-June 2008 37. “Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates”, Michalas, L., G.J. Papaioannou, D.N. Kouvatsos, F.V. Farmakis and A.T. Voutsas, Microelectronic Engineering 85 (5-6), 976, May-June 2008 38. “Processing effects on the dissolution properties of thin chemically amplified photoresist films”, D.Drygiannakis, G.P.Patsis, K.vanWerden, A.Boudouvis, I.Raptis, Microelectronic Engineering 85 955(2008) 39. “High-aspect-ratio micro/nano machining with proton beam writing on aqueous developable - easily stripped negative chemically amplified resists”, M.Chatzichristidi, E.Valamontes, N.Tsikrikas, P.Argitis, I.Raptis, J.A.van Kan, F.Zhang, F.Watt, Microelectronic Engineering 85 945(2008) 40. “Monolithic Silicon Optocoupler Engineering for Advanced Sensing Applications”, K.Misiakos, E.Makarona, M.Kitsara, I.Raptis, Microelectronic Engineering 85 1074(2008) 41. “Stochastic simulation studies of molecular resists for the 32nm technology node”, D.Drygiannakis, G.P.Patsis, N.Tsikrikas, G.Kokkoris, I.Raptis, A.Boudouvis, E.Gogolides, P.Argitis, Microelectronic Engineering 85 949(2008) 42. “Field-effect transistors with thin ZnO as active layer for gas sensor applications”, F. V. Farmakis, A. Speliotis, K. P. Alexandrou, C. Tsamis, M. Kompitsas, I. Fasaki, P. Jedrasik, G. Petersson, B. Nilsson, Microelectronic Engineering 85 (5-6), pp. 1035-1038 (2008) 43. “Metallic bonding methodology for heterogeneous integration of optoelectronic dies to CMOS circuits”, P. Robogiannakis, E.D. Kyriakis-Bitzaros, K. Minoglou, S. Katsafouros, A. Kostopoulos, G. Konstantinidis, G. Halkias, Microelectronic Engineering, Vol. 85, pp. 727-732, April 2008 44. “Morphology, structure, chemical composition, and light emitting properties of very thin anodic silicon films fabricated using short single pulses of current”, Gardelis, S., Nassiopoulou, A.G., Petraki, F., Kennou, S., Tsiaoussis, I., Frangis, N., J. of Appl. Phys., 103 (10), art. no. 103536 (2008) 45. “Surface-related states in oxidized silicon nanocrystals enhance carrier relaxation and inhibit auger recombination”, Othonos, A., Lioudakis, E., Nassiopoulou, A.G., Nanoscale Research Letters, 3(9), pp.315-320(2008)doi 10.1007/s11671-008-9159-8 and selected for open-access presentation to the OAtube Nanotechnology 1 (2008) 903 (http://www.oatube.org/2008/09/aothonos.html) 46. “Determination of critical points on silicon nanofilms: surface and quantum confinement effects”, E. Lioudakis, A. Othonos and A. G. Nassiopoulou, Phys. Stat. Sol. (c), 5 (2008) 3776, DOI 10.1002/pssc.200780109 (2008) 47. Multilevel charge storage in Si nanocrystals arranged in double-dot-layers within SiO2”, Theodoropoulou, M., Nassiopoulou, A.G., Microelectronic Engineering 85 (12), pp. 2362-2365 (2008) 48. “Thermal conductivity of SiC nanowires”, N. Papanikolaou, J. Phys.: Condens. Matter 20, 135201 (2008) 49. “Molecular storage elements for proton memory devices”, Eleftherios Kapetanakis, Antonios M. Douvas, Dimitris Velessiotis, Eleni Makarona, Panagiotis Argitis, Nikos Glezos, and Pascal Normand, Adv. Mater. 20 (23), 2008, pp. 4568-4574 50. “Dynamics and laser processing of functional fluoride organic surfaces at VUV wavelengths”, E. Sarantopoulou, Z. Kollia, M. Chatzichristidi, A. Douvas, P. Argitis, S. Kobe, A. C. Cefalas, J. of Laser Micro/Nanoengineering 3, 24-29 (2008) 51. “Vertical devices of self-assembled hybrid organic/inorganic monolayers based on tungsten polyoxometalates”, E. Makarona, E. Kapetanakis, D.M. Velessiotis, A. Douvas, P. Argitis, P. Normand, T. Gotszalk, M. Woszczyna, N. Glezos, Microelectronic Engineering 85 (5-6), pp. 1399-1402 52. “Polyoxometalate-based layered structures for charge transport control in molecular devices”, Douvas, A.M., Makarona, E., Glezos, N., Argitis, P., Mielczarski, J.A., Mielczarski, E., ACS Nano 2 (4), 2008, pp. 733-742 53. “Nanostructured oxides on porous silicon microhotplates for NH3 sensing” R.Triantafyllopoulou, X.Illa, O.Casals, S.Chatzandroulis, C.Tsamis, A.Romano-Rodriguez, J.R. Morante, (2008) Microelectronic Engineering 85 (5-6), pp. 1116-1119. 54. “Design and fabrication of a Si micromechanical capacitive array for DNA sensing”, V.Tsouti, S.Chatzandroulis, D.Goustouridis, P.Normand, D.Tsoukalas, (2008) Microelectronic Engineering, 85 (5-6), pp. 1359-1361 55. “Detection of the Biotin-Streptavidin interaction by exploiting surface stress changes on ultrathin Si membranes", V.Tsouti, C.Boutopoulos, P.Andreakou, M.Ioannou, I.Zergioti, D.Goustouridis, D.Kafetzopoulos, D.Tsoukalas, P.Normand, S.Chatzandroulis, Microelectronic Engineering, doi:10.1016/j.mee.2008.11.058 56. “Electrical and optical evaluation of polymer composites for chemical sensing applications”, G. Dendrinos, L. Quercia, I. Raptis, K. Manoli, S. Chatzandroulis, D. Goustouridis, K. Beltsios, Microelectronic Engineering, doi:10.1016/j.mee.2008.12.001 57. “Plasma processing for polymeric microfluidics fabrication and surface modification: Effect of super-hydrophobic walls on electroosmotic flow”, N. Vourdas, A. Tserepi, A.G. Boudouvis, E. Gogolides, Microelectronic Engineering, 85 (5-6), pp. 1124-1127, (2008) 58. “High-aspect-ratio plasma-induced nanotextured poly(dimethylsiloxane) surfaces with enhanced protein adsorption capacity”, Vlachopoulou, M.E., Petrou, P.S., Kakabakos, S.E., Tserepi, A., Gogolides, E., J. of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 26 (6), pp. 2543-2548, (2008) 59. “Integration of microfluidics with a love wave sensor for the fabrication of a multisample analytical microdevice”, Mitsakakis, K., Tserepi, A., Gizeli, E., Journal of Microelectromechanical Systems, 17 (4), pp. 1010-1019, (2008) 60. “Fabrication of a micro-column for gas separation using poly (dimethylsiloxane) as structural and functional material”, A. Malainou, M. E. Vlachopoulou, R. Triantafyllopoulou, A. Tserepi, and S. Chatzandroulis, J. Micromech. Microeng., 18, 105007 (2008) 61. “The potential of neutral beams for deep silicon nanostructure etching”, Kokkoris, G., Tserepi, A., Gogolides, E., J. of Physics D: Appl. Phys., 41 (2), art. no. 024004 (2008) 62. “A global model for C4F8 plasmas coupling gas phase and wall surface reaction kinetics”, Kokkoris, G., Goodyear, A., Cooke, M., Gogolides, E., J. of Physics D: Appl. Phys., 41 (19), art. no. 195211, (2008) 63. “Nonlinear classical model for the decay widths of isoscalar giant monopole resonances”, Papachristou, P.K., Mavrommatis, E., Constantoudis, V., Diakonos, F.K., Wambach, J., Physical Review C - Nuclear Physics, 77 (4), art. no. 044305, (2008) 64. “Rare events and their impact on velocity diffusion in a stochastic Fermi-Ulam model”, Karlis, A.K., Diakonos, F.K., Constantoudis, V., Schmelcher, P., Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, 78 (4), art. no. 046213, (2008) 65. “Scattering off an oscillating target: Basic mechanisms and their impact on cross sections”, Brouzos, I., Karlis, A.K., Chrysanthakopoulos, C.A., Diakonos, F.K., Constantoudis, V., Schmelcher, P., Benet, L., Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, 78 (5), art. no. 056207, (2008) 66. “Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique”, Moschou, D.C., M.A. Exarchos, D.N. Kouvatsos, G.J. Papaioannou, A. Arapoyanni and A.T. Voutsas, Microelectronics Reliability 48 (8-9), 1544, 2008 67. “Hot carrier stress induced degradation of SLS ELA polysilicon TFTs – Effects of gate width variation and device orientation”, Kontogiannopoulos, G.P., F.V. Farmakis, D.N. Kouvatsos, G.J. Papaioannou and A.T. Voutsas, Sol. State Electr. 52 (3), 388, 2008 68. “Role of band gap states on the electrical behaviour of sequential lateral solidified polycrystalline silicon TFTs”, Michalas, L., G.J. Papaioannou, D.N. Kouvatsos and A.T. Voutsas, Journal of the Electrochem. Soc. 155 (1), H1, 2008 69. “Electrical properties of metal-oxide-semiconductor structures with low-energy Ge-implanted and annealed thin gate oxides”, E. Kapetanakis, P. Normand, P. Holliger, J. of Appl. Phys. 103, art. no. 064515 (2008) 70. “Electrical behavior of memory devices based on fluorene-containing organic thin films”, P. Dimitrakis, P. Normand, D. Tsoukalas, C. Pearson, J.H. Ahn, M.F. Mabrook, D.A. Zeze, M.C. Petty, K.T. Kamtekar, C. Wang, M.R. Bryce, M. Green, J. of Appl. Phys. 104, art. no. 044510 (2008) 71. “Study of charge storage characteristics of memory devices embedded with metallic nanoparticles”, Ch. Sargentis, K. Giannakopoulos, A. Travlos, P. Normand, D. Tsamakis, Superlattices and Microstructures 44, 483-488 (2008) 72. “Silicon nanoparticles synthesized in SiO2 pockets by stencil-masked low energy ion implantation and thermal annealing”, J. Grisolia, C. Dumas, G. Ben Assayag, C. Bonafos, S. Schamm, A. Arbouet, V. Paillard, M.A.F. van den Boogaart, J. Brugger, P. Normand, Superlattices and Microstructures 44, 395-401 (2008) 73. “Surface modification of polymeric thin films at SiO2 interfaces with vacuum ultraviolet light”, E.Sarantopoulou, J.Kovač, Z.Kollia, I.Raptis, S.Kobe, A.C.Cefalas, Surf. Interface Anal. 40 400(2008) 74. “Aqueous base developable - easy stripping, high aspect ratio negative photoresist for optical and proton beam lithography”, M.Chatzichristidi, I.Rajta Th.Speliotis, E.Valamontes, D.Goustouridis, P.Argitis, I.Raptis, Microsyst. Technol. 14 1423(2008) 75. “Lithographically-fabricated disposable bismuth-film electrodes for the trace determination of Pb(II) and Cd(II) by anodic stripping voltammetry”, Ch.Kokkinos, A.Economou, I.Raptis, C.E.Efstathiou, Electroch. Acta. 53 5294(2008) 76. “Magneto-transport properties of [Co/Bi]n wire structures”, C.Christides, Th.Speliotis, M.Chatzichristidi, I.Raptis, J. Magn. Magn. Mater. 320 e720(2008) 77. “Disposable mercury-free cell-on-a-chip devices with integrated microfabricated electrodes for the determination of trace nickel(II) by adsorptive stripping voltammetry”, Ch.Kokkinos, A.Economou, I.Raptis, Th.Speliotis, Anal. Chem. Acta 622 111(2008) 78. “Detection of CO and NO Using Low Power Metal Oxide Sensors”, R. Triantafyllopoulou, and C. Tsamis, Phys. Stat. Sol. (c) 5, No. 12, 3647–3650 (2008) 79. “Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-Silicon substrates”, N. Kelaidis, V. Ioannou-Sougleridis, D. Skarlatos, C. Tsamis, C. A. Krontiras, S. N. Georga, B. Kellerman, M. Seacrist., Thin Solid Films, Volume 517, Issue 1, p. 350-352, 2008 80. “Structural and sensing properties of nanocrystalline SnO2 films deposited by spray pyrolysis from a SnCl2 precursor”, Gaiduk, P.I., Kozjevko, A.N., Prokopjev, S.L., Tsamis, C., Nylandsted Larsen, A., Appl. Phys. A: Materials Science and Processing 91 (4), pp. 667-670 (2008) 81. “Capillary-based immunoassays, immunosensors and DNA sensors - steps towards integration and multi-analysis.”, Mastichiadis, C., Niotis, A.E., Petrou, P.S., Kakabakos, S.E., Misiakos, K., TrAC - Trend Anal. 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"Self-assembly of single thin Au nanoparticle chains on Si along V-groove-etched lines between micrometer-distant electrodes by dielectrophoresis" A. Zoy, A. A. Nassiopoulos and A. G. Nassiopoulou Nanotechnology 18 345608 (2007) 5. “Two-silicon-nanocrystal layer memory structure with improved retention characteristics”, A. G. Nassiopoulou and A. Salonidou, J. Nanosci. Nanotechnol., vol. 7, 368-373 (2007) 6. “Ge quantum dot memory structure with laterally ordered highly dense arrays of Ge dots”, A. G. Nassiopoulou, A. Olzierski, E. Tsoi, I. Berbezier and A. Karmous, J. Nanosci. Nanotechnol., vol. 7, 316-321 (2007) 7. "The role of surface vibrations and quantum confinement effect to the optical properties of very thin nanocrystalline silicon films", Lioudakis, E., Antoniou, A., Othonos, A., Christofides, C., Nassiopoulou, A.G., Lioutas, Ch.B., Frangis, N., J. of Appl. Physics 102 (8), art. no. 083534 (2007) 8. "Ultra-thin films with embedded Si nanocrystals fabricated by electrochemical dissolution of bulk crystalline Si in the transition regime between porosification and electropolishing", Gardelis, S., Tsiaoussis, I., Frangis, N., Nassiopoulou, A.G., Nanotechnology 18 (11), art. no. 115705 (2007) 9. "Few nanometer thick anodic porous alumina films on silicon with high density of vertical pores", Kokonou M., Giannakopoulos K.P., Nassiopoulou A.G., Thin Solid Films 515, pp. 3602-3606 (2007) 10. "A silicon thermal accelerometer without solid proof mass using porous silicon thermal isolation" D. Goustouridis, G. Kaltsas and A. G. Nassiopoulou IEEE Sensors Journal, vol. 7 No 7 983 (2007) 11. "Quntum confinement and interface structure of Si nanocrystals of sizes 3-5 nm embedded in α-SiO2" E. Lioudakis, A. Othonos, G. C. Hadjisavvas, P. C. Kelires and A. G. Nassiopoulou, Physica E 38 128-134 (2007) 12. "Charging/discharging kinetics in LPCVD silicon nanocrystal MOS memory structures", V. 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Bagrets, N. Papanikolaou, and I. Mertig, Phys. Rev. B 73, 045428 (2006) 34. “Partially fluorinated, polyhedral oligomeric silsesquioxane-functionalized (meth)acrylate resists for 193 nm bilayer lithography”, A.M. Douvas, Van Roey, F., Goethals, M., Papadokostaki, K.G., Yannakopoulou, K., Niakoula, D., Gogolides, E., Argitis, P., Chemistry of Materials 18 (17), 4040-4048, 2006. 35. “Photochemically-induced ligand exchange reactions of ethoxy-oxo-molybdenum(V) tetraphenylporphyrin in chlorinated solvents”, A.M. Douvas, P. Argitis, A. Maldotti and A. G. Coutsolelos, Polyhedron, 25, 3427-34, 2006. 36. “Plasma oxidation of Polyhedral Oligomeric Silsesquioxane (POSS) polymers”,D. Eon, G. Cartry, C. Cardinaux, N. Vourdas, P. Argitis, E. Gogolides, J. Vac.Sci.Technol. B, 24, 2678-88, 2006. 37. “Protonic methacrylate polymeric electrolytes for all-solid-state WO3-based electrochromic displays”, M. Vasilopoulou, I. Raptis, P Argitis, G. Aspiotis and D Davazoglou, Microelectron Eng., 83, 1414-1417, 2006. 38. “Electrical characterization of molecular monolayers containing tungsten polyoxometalates”, Nikos Glezos, Antonios M. Douvas, Panagiotis Argitis, Frank Saurenbach, Juergen Chrost and Christos Livitsanos, Microelectronic Engineering, 83, 1757-1760, 2006. 39. “Layer-by-layer UV micromachining methodology of epoxy resist embedded microchannels”, M. Kitsara, M. Chatzichristidi, D. Niakoula, D. Goustouridis, K. Beltsios, P. Argitis and I. Raptis, Microelectronic Engineering, 83, 1298-1301, 2006 40. “Nano-scale spatial control over surface morphology of biocompatible fluoropolymers at 157 nm”, E. Sarantopoulou, Z. Kollia, A. C. Cefalas, A.M. Douvas, M. Chatzichristidi, P. Argitis, S. Kobe, Materials Science and Engineering C, in press, available online 17 November 2006. 41. “A biomolecule friendly photolithographic process for fabrication of protein microarrays on polymeric films coated on silicon chips”, P.S. Petrou, M. Chatzichristidi, A. M. Douvas, P. Argitis, K. Misiakos and S.E. Kakabakos, Biosensors and Bioelectronics, in press, available online 5 October 2006. 42. “Optical and structural properties of copper oxide thin films grown by oxidation of metal layers”, G. Papadimitropoulos, N. Vourdas, V. Em. Vamvakas and D. Davazoglou, Thin Solid Films 515 (4), pp. 2428-2432, 2006 43. “Parasitic memory effects in shallow-trench-isolated nanocrystal memory devices”, P. Dimitrakis, P. Normand, Solid-State Electronics, In Press, Corrected Proof, Available online 12 December 2006 44. “Proton radiation tolerance of nanocrystal memories”, E. Verrelli, I. Anastassiadis, D. Tsoukalas, M. Kokkoris, R. Vlastou, P. Dimitrakis and P. Normand, Physica E: Low-dimensional Systems and Nanostructures, In Press, Accepted Manuscript, Available online 16 December 2006 45. “Device degradation behavior and polysilicon film morphology of TFTs fabricated using advanced excimer laser lateral solidification techniques”, D.N. Kouvatsos, A.T. Voutsas, L. Michalas, F. Farmakis and G.J. Papaioannou, accepted to appear (available online) in Thin Solid Films. 46. “An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors”, L. Michalas, M. Exarchos, G.J. Papaioannou, D.N. Kouvatsos and A.T. Voutsas, accepted to appear (available online) in Microelectronics Reliability. 20051. "Ultra thin porous anodic alumina films with self-ordered cylindrical vertical pores on a p-type silicon substrate" , M. Kokonou, A. G. Nassiopoulou and K. P. Giannakopoulos, Nanotechnology 16, 103, (2005). 2. "Structural study of very thin anodic alumina films on silicon by anodization in citric acid aqueous solution" , M. Kokonou, A. G. Nassiopoulou, K. G. Giannakopoulos, N. Boukos, A. Travlos, J. Nanoscience and Nanotechnology v.5, 1-5, 454-458, (2005). 3. "Optical properties of Si quantum wires and dots" , X. Zianni and A. G. Nassiopoulou, Review Paper, Handbook of Theoretical and Computational Nanotechnology, edited by Michael Rieth and Wolfram Schommers, American Scientific Publishers, vol. 1 chapter 94, pages 1-37, (2005). 4. "Fractal roughness of polymers after lithographic processing" , V. Constandoudis, E. Gogolides, G. P. Patsis, V. Sarris, A. Tserepi, C. Diakoumakos, E.S. Valamontes, Jpn. J. Appl. Physics Vol.44 (5A), ppL186-189 (2005). 5. "Proton beam micromachining on strippable aqueous base developable negative resist" , I.Rajta E.Baradacs, M.Chatzichristidi, E.S.Valamontes, I.Uzonyi, I.Raptis, Nucl. Instrum. Meth. B 231, 423 (2005) . 6. "Imprint lithography on poly(2-hydroxyethyl methacrylate), (PHEMA), and epoxydised novolac, (EPN) polymers" , F.A.Zacharatos, A.Olziersky, I.Raptis, E.Hristoforou J. Optoelectron. Adv. Mater. 7 1121(2005) . 7. "Polymeric film characterization for use in bimorph chemical sensors" , S. Chatzandroulis, D. Goustouridis, I. Raptis Microelectron. Eng. 78-79 118(2005). 8. "Characterization of Polymer Layers for Silicon Micromachined Bilayer Chemical Sensors Using White Light Interferometry" , D. Goustouridis, K. Manoli, S. Chatzandroulis, M. Sanopoulou, I.Raptis, Sens. Act. B 111-112, 549 (2005) . 9. "Fabrication and characterization of magnetically hard CoPt ordered sub-micron structures" , L. Castaldi, I . Raptis, E. Manios, D. Niarchos, J. Optoelectron. Adv. Mater. 7, 1605 (2005) . 10. "Composition effects in polymer blends spin-cast on patterned substrates" , J. Raczkowska, P. Cyganik, A. Budkowski, A. Bernasik, J. Rysz, I. Raptis, P. Czuba, K. Kowalski, Macromolecules (2005). 11. "A Si/SiGe MOSFET utilizing low-temperature wafer bonding" , S. Koliopoulou, P. Dimitrakis, D. Goustouridis, S. Chatzandroulis, P. Normand, D. Tsoukalas and H. Radamson, Microelectronic Engineering 78-79, 244 (2005). 12. "Fabrication of nanocrystal memories by ultra low energy ion implantation" , N. Cherkashin, C. Bonafos, H. Coffin, M. Carrada, S. Schamm, G. Ben Assayag, D. Chassaing, P. Dimitrakis, P. Normand, M. Perego, M. Fanciulli, T. Muller, K. H. Heinig, Physica Status Solidi (c) 2,1907 (2005). 13. "Size and aerial density distributions of Ge nanocrystals in a SiO2 layer produced by molecular beam epitaxy and rapid thermal processing" , A. Kanjilal, J.L. Hansen, A. Nylandsted Larsen, P. Normand, P. Dimitrakis, D. Tsoukalas, N. Cherkashin, A. Claverie, Applied Physics A 81, 363-366 (2005). 14. "The effect of Generation-Recombination mechanisms on the transient behavior of polycrystalline silicon transistors" , G. J. Papaioannou, A. Voutsas, M. Exarchos and D. Kouvatsos, Thin Solid Films 487 (1-2), 247, September 2005. 15. "Characterization of various insulators for possible use as low-k dielectrics deposited at temperatures below 200 C" , M. Vasilopoulou, A. Douvas, D. Kouvatsos, P. Argitis and D. Davazoglou, Microelectronics Reliability 45 (5-6), 990, May 2005. 16. "Effect of silicon thickness on the degradation mechanisms of sequential-laterally-solidified polycrystalline silicon thin film transistors during hot-carrier stress" , A. T. Voutsas, D.N. Kouvatsos, L. Michalas and G.J. Papaioannou, IEEE Electron Device Letters EDL-26 (3), 181, March 2005. 17. "Monte Carlo Simulations of Ferromagnetism in p-Cd(1-x)Mn(x)Te Quantum Wells" , D. Kechrakos, N. Papanikolaou, K.N. Trohidou, and T. Dietl, Phys. Rev. Lett. 94, 127201 (2005). 18. "Indium oxide as a possible tunnel barrier in spintronic devices" , Androulakis, S. Gardelis, J. Giapintzakis, E. Gagaoudakis, G. Kiriakidis, Thin Solid Films 471, 293 (2005). 19. "Oxidation enhanced diffusion (OED) of boron in very low energy N+2 - implanted silicon" , D. Skarlatos, C. Tsamis, M. Perego, and M. Fanciulli, J. Appl. Phys. 97, 113534 (2005). 20041. "Polyhedral oligomeric silsesquioxane (POSS) acrylate copolymers for microfabrication: properties and formulation of resist materials", E. Tegou, V. Bellas, E. Gogolides and P. Argitis, Microelectronic Engineering, 73/74, 238-243, (2004) 2. "Polyhedral oligomeric silsesquioxane (POSS) based resists: material design challenges and evaluation at 157 nm", E. Tegou, V. Bellas, E. Gogolides, P. Argitis, D. Eon, G. Catry, C. Cardinaud, Chem. Mater, 16, 2567-77, (2004) 3. "Glass transition temperature monitoring in bilayer and patterned photoresist films", D. Niakoula, I. Raptis, D. Goustouridis, P. Argitis, Jpn. J. Appl. Phys., 43 (8A), 5247-8, (2004) 4. "Surface segregation of photoresist copolymers containing polyhedral oligomeric silsesquioxanes studied by X-ray photoelectron spectroscopy", D. Eon, G. Cartry, V. Fernandez, C. Cardinaux, E. Tegou, V. Bellas, P. Argitis, E. Gogolides, J. Vac. Sci. Technol. B, 22, 2526-32, (2004) 5. "Evaluation of poly (hydroxyethyl methacrylate) imaging chemistries for micropatterning applications", M. Vasilopoulou, S. Boyatzis, I. Raptis, D. Dimotikalli, P. Argitis, J. Mater. Chem., 14, 3312-20, (2004) 6. "Development and molecular-weight issues on the lithographic performance of poly (methyl methacrylate)", A. Olzierski, I. Raptis, Microelectron. Eng. 73-74 244-251 (2004) 7. "Resists for nanolithography", P. Argitis, Encyclopedia of Nanoscience and Nanotechnology, H. S. Nalwa ed., American Scientific Publishers, (March 2004) 8. "Line Edge Roughness (LER) investigation on chemically amplified resist (CAR) materials with masked helium ion beam lithography", S. Eder-Kapl, H. Loeschner, M. Zeininger, O. Kirch, G. P. Patsis, V. Constantoudis, and E. Gogolides, Microelectronic Engineering, 73-74, 252 (2004) 9. "Photoresist line-edge roughness analysis using scaling concepts", V. Constantoudis, G. P. Patsis, and E. Gogolides, J. Microlithogr. Microfabrication, Microsyst. 3, 429 (2004) 10. "Effects of photoresist polymer molecular weight on line-edge roughness and its metrology probed with Monte Carlo simulations", G.P. Patsis, V. Constantoudis, and E. Gogolides, Microelectronic Engineering 75(3), 297 (2004) 11. "Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions", V. Constantoudis, G. P. Patsis, L. H. A. Leunissen, and E. Gogolides, J. Vac. Sci. Technol. B (22), 1974 (2004), and Virtual Journal of Nanoscale Science & Technology-Volume 10, Issue 9 (August 30 2004) 12. "Si etching in high-density SF6 plasmas for microfabrication: Surface roughness formation", E. Gogolides, C. Boukouras, G. Kokkoris, O. Brani, A. Tserepi, V. Constantoudis, Microelectronic Engineering 73-74, 312 (2004) 13. "Oxygen plasma modification of polyhedral oligomeric silsesquioxane (POSS) containing copolymers for micro and nano fabrication", N. Vourdas, V. Bellas, E. Tegou, O. Brani, V. Constantoudis, P. Argitis, A. Tserepi, E. Gogolides, Plasma Processing of Polymers, pp. 281-292, (2004) 14. "Simulation of SiO2 and Si feature etching for microelectronics and MEMS fabrication: a combined simulator coupling modules of surface etching, local flux calculation, and profile evolution", G. Kokkoris, A. Tserepi, A. G. Boudouvis, and E. Goggolides, J. Vac. Sci. Technol. A 22, 1896 (2004) 15. "Selective Plasma-induced Deposition of Fluorocarbon Films on Metal Surfaces for actuation in microfluidics", P. Bayiati, A. Tserepi, E. Gogolides, K. Misiakos, J. Vac. Sci. Technnol. A 22(4), 1546-1551, (July/August 2004) 16. "Nitrogen distribution during oxidation of low and medium energy nitrogen - implanted Silicon", Skarlatos D., Perego M., Tsamis C., Ferrari S., Fanciulli M. and Tsoukalas D., Nuclear Instruments and Methods in Physics Research, B 216, p.75-79, (2004) 17. "Oxidation of nitrogen - implanted silicon: Comparison of nitrogen distribution and electrical properties of oxides formed by very low and medium energy N2+ implantation", Skarlatos D., Kapetanakis E., Normand P., Tsamis C., Perego M., Ferrari S., Fanciulli M. and Tsoukalas D., Journal Of Appl. Physics, 96 (1), p. 300-309 (2004) 18. " Comparison of FTIR transmission spectra of thermally and LPCVD grown by TEOS pyrolysis, SiO2 films", Vassilis Em. Vamvakas and D. Davazoglou, Journal of the Electrochemical Society Vol. 151, 93 (2004) 19. "Fabrication of very fine copper lines on silicon substrates patterned with PMMA via selective chemical vapor deposition" D. Davazoglou, I Raptis, A. Gleizes and M. Vasilopoulou Journal of Vacuum Science and Technology B Vol. 22, 859 (2004) 20. "Optical properties of SiO2-TiO2 sol-gel thin films" P. Chrysicopoulou, D. Davazoglou, C. Trapalis and G. Kordas Journal of Materials Science 39 (8): 2835-2839 (2004) 21. "Silicon nanocrystals in SiO2 thin layers", Nassiopoulou A. G., Encyclopedia of Nanoscience and Nanotechnology, edited by H. S. Nalwa, vol. 9 p. 793-813 (2004) 22. "Selective self-alignment of Au nanoparticle-coated K2SO4 microcrystals in micrometer gratings of V-grooves on a silicon substrate", Nassiopoulou A. G., Zoy A., Ioannou-Sougleridis V., Olzierski A., Travlos A., Martinez-Albertos J. L. and Moore B., Nanotechnology 15, 1-5, 352-356, (2004) 23. "Growth of two-dimensional arrays of silicon nanocrystals in thin SiO2 layers by low pressure chemical vapour deposition and high temperature annealing/oxidation. Investigation of their charging properties", Salonidou A., Nassiopoulou A. G., Travlos A., Ioannou-Sougleridis V. and Tsoi E., Nanotechnology 15, 1-7, 1233-1239, (2004) 24. "Transient and ac electrical transport under forward and reverse bias conditions in aluminium/ porous silicon/p-cSi structures", Theodoropoulou M., Karahaliou P. K., Krontiras C. A., Georga S. N., Xanthopoulos N., Tsamis C. and Nassiopoulou A. G., J. Appl. Phys. 96, 12, (2004) 25. "Influence of magnetic field on electromagnetic instabilities in Semiconductor superlattices", Tarkhanyan R. H. and Nassiopoulou A. G., J. Nanosci. Nanotech. 4, 1085, (2004) 26. "Two-dimensional arrays of nanometer scale holes and nano-V-grooves in oxidized Si wafers for the selective growth of Ge dots or Ge/Si hetero-nanocrystals", Olzierski A., Nassiopoulou A. G., Raptis I. and Stoica T., Nanotechnology 15, 1695-1700 (2004) 27. "Transient and ac conductivity of nanocrystalline porous alumina thin films on silicon, with embedded silicon nanocrystals", J. of Applied Physics, 95,5, 2776-2780 (2004) 28. "Nanocrystals manufacturing by ultra-low-energy ion-beam-synthesis for nonvolatile memory applications", P. Normand, E. Kapetanakis, P. Dimitrakis, D. Skarlatos, K. Beltsios, D. Tsoukalas, C. Bonafos, G. Ben Asssayag, N. Cherkashin, A. Claverie, J. A. Van Den Berg, V. Soncini, A. Agarwal, M. Ameen, M. Perego, M. Fanciulli, Nucl. Instr. Meth. Phys. Res. B (NIMB) 216, 228-238 (2004) 29. "Silicon nanocrystal memory devices obtained by ultra-low-energy ion-beam-synthesis", P. Dimitrakis, E. Kapetanakis, D. Tsoukalas, D. Skarlatos, C. Bonafos, G. Ben Asssayag, A. Claverie, M. Perego, M. Fanciulli, V. Soncini, R. Sotgiu, A. Agarwal, M. Ameen, P. Normand, Solid State Electronics 48, 1511-1517 (2004) 30. "Manipulation of two-dimensional arrays of Si nanocrystals embedded in thin SiO2 layers by low energy ion implantation", C. Bonafos, M. Carrada, N. Cherkashin, H. Coffin, D. Chassaing, G. Ben Assayag, A. Claverie, T. Muller and K. H. Heinig, M. Perego and M. Fanciulli, P. Dimitrakis, P. Normand, J. Appl. Phys. 95, 5696-5702 (2004) 31. "Size and aerial density distributions of Ge nanocrystals in a SiO2 layer produced by molecular beam epitaxy and rapid thermal processing", A. Kanjilal, J. Lundsgaard Hansen, P. Gaiduk, A. Nylandsted Larsen, P. Normand, P. Dimitrakis, D. Tsoukalas, N. Cherkashin, A. Claverie, Appl. Phys. A - Mater. Sc. Process. Online (June 2004) 32. "Processing issues in silicon nanocrystal manufacturing by ultra-low-energy ion-beam-synthesis for non-volatile memory applications", P. Normand, P. Dimitrakis, E. Kapetanakis, D. Skarlatos, K. Beltsios, D. Tsoukalas, C. Bonafos, H. Coffin, G. Benassayag, A. Claverie, V. Soncini, A. Agarwal, Ch. Sohl, M. Ameen, Microelectronic Engineering 73-74, 730-735 (2004) 33. "Integration of organic insulator and self-assembled gold nanoparticles on Si MOSFET for non-volatile memory cells", S. Kolliopoulou, P. Dimitrakis, P. Normand, H-L. Zhang, N. Cant, S. D. Evans, S. Paul, C. Pearson, A. Molloy, M. C. Petty, D. Tsoukalas, Microelectronic Engineering 73-74, 725-729 (2004) 34. "Tunneling and negative resistance effects for composite materials containing polyoxometalate molecules", G. Chaidogiannos, D. Velessiotis, P. Argitis, P. Koutsolelos, C. D. Diakoumakos, D. Tsamakis and N. Glezos, Microel. Eng. 73-74, 746 (2004) 35. "Capacitive Type Chemical Sensors Using Thin Silicon/Polymer Bimorph Membranes", S. Chatzandroulis, E. Tegou, D. Goustouridis, S. Polymenakos, D. Tsoukalas, Sensors and Actuators B: Chemical, Volume 103, Issues 1-2, Pages 392-396, (29 September 2004) 36. "Fabrication of Chemical Sensors based on Si/polymer bimorphs", S. Chatzandroulis, E. Tegou, D. Goustouridis, S. Polymenakos, D. Tsoukalas, Microelectronic Engineering, Volumes 73-74, Pages 847-851 (June 2004) 37. "Characterization of Polymer Layers for Silicon Micromachined Bilayer Chemical Sensors Using White Light Interferometry", D. Goustouridis, K. Manoli, S. Chatzandroulis, M. Sanopoulou, I. Raptis accepted for publication in Sensors and Actuators B 38. "The influence of thermal treatment on the stress characteristics of suspended Porous Silicon membranes on silicon", D. Papadimitriou, C. Tsamis and A. G. Nassiopoulou, Sensors and Actuators B: Chemical, Volume 103, Issues 1-2, Pages 356-361 (2004) 39. "Protein patterning by micromachined silicon embossing on polymer surfaces", Goustouridis D, Misiakos K, Petrou P S, Kakabakos S E, Applied Physics Letters 85 (26): 6418-6420 (December 27 2004) 40. "Selective plasma-induced deposition of fluorocarbon films on metal surfaces for actuation in microfluidics", Bayiati P, Tserepi A, Gogolides E, Misiakos K, Journal Of Vacuum Science & Technology A 22 (4): 1546-1551 (Jul-Aug 2004) 41. "Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors", Kouvatsos, D. N., Davidovic V., Papaioannou G. J., Stojadinovic N., Michalas L., Exarchos M., Voutsas A. T. and Goustouridis D., Microelectronics Reliability 44 (9-11), 1631, (September 2004) 42. "Low temperature wafer bonding for thin silicon film transfer", D. Goustouridis, K. Minoglou, S. Kolliopoulou, S. Chatzandroulis, P. Morfouli, P.Normand and D. Tsoukalas, Sensors and Actuators A: Physical Volume 110, Issues 1-3, 401-406, (February 2004) 43. "A compact non-linear equivalent circuit model and parameter extraction method for packaged high-speed VCSELs", K. Minoglou, E. D. Kyriakis-Bitzaros, D. Syvridis, G. Halkias, IEEE Journal of Lightwave Technology, Vol.22, No.12, pp.2823-2827, (December 2004) |
Journal Papers
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