NCSR - Demokritos
Welcome to the Department of Microelectronics
(IMEL) / IAMPPMN / NCSR "Demokritos"
Facilities

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LABORATORIES AND CENTRAL FABRICATION FACILITIES AT IMEL

The facilities and equipment of IMEL include a full silicon processing laboratory in a clean room, equipped with lithography (optical, e- beam) and etching tools, thermal and chemical processing facilities, ion implantation, deposition of metals, dielectrics and poly- nanocrystalline silicon by physical and chemical processes (LPCVD, sputtering, e-gun and thermal evaporation), and process inspection equipment. Satellite laboratories include electrical and optical characterization, micromachining and packaging laboratory, resist development laboratory, electron microscopy (SEM, STM/AFM), sensor characterization and testing equipment.
The clean room area for thermal, chemical and reactive ion etching processes of the Institute has been fully upgraded to class 1000, while lithography area to class 100, in the year 2002.
A new building of the Institute has been constructed in 2006 to host the electrical, optical and structural characterization laboratories. A photograph of the building in the final stage of construction is shown in the figure below.

 

NANOTECHNOLOGY AND MEMS LABORATORY. ACCESS PROVIDED

The laboratory is certified under ISO 9001:2000 (Si processing and electrical characterizartion) and under ISO 17025:2005 (electrical measurements).
The equipment available and the expertise and competences include the following:

 

PROCESSING

Equipment

Techniques/competences

Silicon processing laboratory in a clean room area of 500 m2, equipped with the  following:

  • 4 laminar flow chemical benches

  • 7 horizontal hot-wall furnace tubes

  • 2 horizontal LPCVD tubes for
    nitride, oxide (TEOS), polysilicon


  • 1 horizontal LPCVD tube for LTO

  • Ion Implanter (EATON medium
    current, 200 KeV)


  • Optical lithography systems (resolution down to 0,6 μm)

  • reactive ion Etcher

  • Metallization equipment (thermal, e-gun evaporation, sputtering)
  • Process inspection equipment

Processing equipment not in clean room:

  • High Density Plasma Etcher

  • Different thin film deposition systems (Sputtering,  MOCVD)
  • Nanopatterning technologies

  • Plasma etching

  • Growth of metals and dielectrics

  • Growth of polycrystalline and nanocrystalline Si

  • Growth of Si nanostructures embedded in a dielectric matrix, ordering of nanostructures

  • Fabrication of MOS capacitors and MOSFETs

  • Nanocrystal non-volatile memories

  • Micromachining, sensor fabrication, microfluidics

  • Molecular materials and devices

  • Thin film devices

 

 

CHARACTERIZATION  &  MODELLING

Equipment

Techniques/competences


Electrical

  • Several probe stations 

  • HP measuring systems (4142B, 4084B, 8110A, 700i series, 4140B, 4284, 4192A, 34401, 16500A)     

  • Keithley measuring equipment (230, 220, 617, 195A,517A) 

  • Oxford optistat cryostat for temperatures in the range 4.220K 

  • Wafer level cryogenic measurements (Janis probe station)

  • Cascade Microtech Summit 9101 Analytical Probe Station for 150mm wafers
                                
  • Anritsu 37269D Vector Network Analyzer 40MHz-40GHz

Optical

  • Jobin Yvon spectrometer, wavelengths 300 - 1600nm     
                                
  • Ar+ laser 

  • HeCd 325 nm laser    
                               
  • UV lamp with monochromator    
                  
  • Oxford optistat cryostat, 4.2-320K      
                              
  • FTIR: Bruker, Tensor 27

Morphology, structural characterization

Testing equipment

  • Systems for testing of gas flow, gas pressure, acceleration, humidity sensors, biosensors and systems, microfluidics testing etc.

Modeling and simulation software

  • SILVACO tools for process and device modeling (Athina and Atlas)

  • Suprem and Pisces

  • Floops and Floods

  • Synopsis – Coventorware

  • MATLAB-FEMlab

  • Mentor graphics


Characterization of Dielectrics                  

  • Admittance measurements (1Hz up to 1MHz, 25-150°C)   
                                                            
  • I-V measurements (2 up to 4-terminal devices, 25-150°C)                                                                 
  • Charge-to-breakdown measurements 
                       
  • Bias-Temperature-Stress measurements                                             

Characterization of MIS Devices             

  • Admittance measurements (1Hz up to 1MHz, 25-150°C)  
                                                            
  • I-V measurements (2 up to 4-terminal devices, 25-150°C)  
                                                                 
  • Hot-carrier stress measurements 
                      
  • Bias-Temperature-Stress measurements                                   

EEPROM device characterization and reliability measurements  
Characterization of RF components 

Optical characterization                                        

  • Absorption measurements, wavelength range UV-VIS-IR  
                                                 
  • Photoluminescence (PL)   
                                  
  • Laser excitation: 325 nm, 457.8nm, 488nm, 514.5nm  
                                        
  • Spectrometer: 350nm-1600nm    
          
  • Electroluminescence (EL): 350nm-1600nm    
                                                    
  • Photocurrent-photovoltage (UV-VIS)  
     
  • FTIR   

Characterterization of sensors                                        

  • Gas sensors

  • Microflow sensors

  • Accelerometers

  • Optical devices

  • Biosensors

  • Microfluidics     

Modeling and simulation                                       

  • Process and device modeling

  • RF modeling

                      

 

 
 
NCSR - Demokritos