NCSR - Demokritos
Welcome to the Institute of Microelectronics (IMEL) / NCSR "Demokritos"
Research Projects Project III.4

  Welcome
   About
   IMEL at a glance
   Location
   Organizational  Structure
 
  Research
   Programmes
 

 Funded Projects

 

 Software
 

  Publications
   Research Papers
   Annual Report
 
  People
   Director
   Staff
   Distinctions
 & Awards
   
  MiNASys Center of
Excellence
   
  Nanotechnology and MEMS laboratory:
Access provided
   
Education
 MSc,
 PhD programs
   Summer Schools
  Job Openings 
  News and Events
  Lectures
  Conferences & Workshops
  Contact Info





Project Information per year
2012
- 2011 - 2010 - 2009 - 2008 - 2007 - 2006 - 2005
- 2004


PROJECT III.4
THIN FILM DEVICES FOR LARGE AREA ELECTRONICS

 

Project leader: D.N. Kouvatsos
Other collaborating researchers: D. Davazoglou, F.V. Farmakis
Ph.D. candidates: D.C. Moschou, G.P. Kontogiannopoulos, L. Michalas (University of Athens).
Ph.D. degrees: M. Exarchos (University of Athens).


Funding

- PENED contract, project code 03ED550, 19/12/2005 – 18/12/2008.
- GSRT bilateral project Greece-Serbia, Polysilicon TFT reliability, 1/11/2004 – 31/10/2006.


Objectives


This research aims at the optimization of the active layer of polysilicon films obtained using advanced excimer laser crystallization methods and of the resulting performance parameters of thin film transistors fabricated in such films. Specifically, the targets are:
- Investigation of the influence of the polysilicon crystallization technique and film thickness on TFT performance, defect densities and degradation for ELA technology optimization.
- Evaluation of device parameter (a) hot carrier and (b) irradiation stress-induced degradation and identification of ageing mechanisms in TFTs fabricated in advanced excimer laser annealed (ELA) polysilicon films.
- Investigation of effects of variations in TFT structure and fabrication process on device performance and reliability.
- Investigation of polysilicon active layer defects using transient drain current analysis in ELA TFTs.
- Evaluation of bias stress-induced instabilities in solid phase crystallized (SPC) TFTs.

back to top
 
 
NCSR - Demokritos